For Developing with Today’s High-Speed Serial Standards, the DSA70000 Digital Serial Analyzer is Your Uncompromised High-Performance, Dedicated Solution to Efficiently Address Your Design Challenges
The DSA70000 Series is a new generation of real-time digital serial analyzers based on the same advanced technology as the DPO70000 real-time digital phosphor oscilloscopes. As high-speed serial technology becomes more pervasive, more designers are looking for easy to use, complete, and dedicated solutions for verifying, characterizing, debugging and testing sophisticated high-speed serial designs. The DSA70000 Series is specifically targeted to address the challenging high speed serial design issues faced by designers, by encapsulating extended high speed serial data domain expertise. It inherits exceptional signal acquisition performance, operational simplicity, and unmatched debugging tools from the DPO70000 Series, to accelerate your day-to-day tasks. It also features the extended analysis tools that enable high speed serial signal analysis and compliance measurements in a specialized instrument.
The DSA70000 Series Analyzers provides the signal fidelity of Tektronix oscilloscopes to ensure confidence in your measurement results: high sample rate on all models, on all channels, to capture more signal details (transients, imperfections, fast edges), 25 GS/s on all four channels for the 4, 6 and 8 GHz models, 50 GS/s on all four channels for the 12.5, 16 and 20 GHz models, bandwidth enhancement as well as best low jitter noise floor and vertical accuracy for very accurate measurements.
The DSA70000 Series provides the longest acquisition of the industry to provide more resolution and longer time sequence—a standard 20 M on the DSA Series, or an optional up to 100 M samples on all four channels for the 4, 6 and 8 GHz models, 200 M samples on all four channels for the 12.5, 16 and 20 GHz models. Easily manage this deep record length and provide detailed comparison and analysis of multiple waveform segments with the MultiView Zoom™ feature.
The DSA70000 analyzers share the DPX technology of the DPO70000 and can deliver high waveform capture rate at more than 300,000 waveforms per second. The DSA70000 Series capture these intermittent fault events that can break a design with the FastAcq acquisition mode. With Pinpoint® triggering, the DSA70000 series is also equipped to isolate a section of a complex signal for further analysis.
To debug serial architectures, the DSA70000 Series features the NRZ serial pattern triggering and protocol decode with built-in clock recovery. It recovers the clock signal, identifies the transitions and decodes characters and other protocol data. You can see the captured bit sequences decoded into their words for convenient analysis (for 8b/10b and other encoded serial data streams), or you can set the desired encoded words for the serial pattern trigger to capture. Lastly, you can synchronize long serial test pattern acquisitions up to 6.25Gb/s to remove random jitter. The DSA70000 Series covers serial standards up to 3.125 Gb/s.
The DSA70000 Series features the highest accuracy jitter and timing measurements as well as comprehensive analysis algorithms. Tight timing margins demand stable, low-jitter designs. You can make jitter measurements over contiguous clock cycles from every valid pulse in a single-shot acquisition. Multiple measurements and trend plots quickly show system timing under variable conditions. It also includes Random Jitter and Deterministic Jitter separation as well as Total Jitter measurement at Bit Error Ratio to 10-18
Communications Mask Testing provides a complete portfolio of masks for verifying compliance to serial communications standards. It supports 156 Standards Masks – ITU-T (1.544 Mb/s to 155 Mb/s)/ANSI T1.102 (1.544 Mb/s to 155 Mb/s); Ethernet IEEE 802.3; ANSI X3.263 (1.544 Mb/s to 3.125 Gb/s XAUI); Sonet/SDH (51.84 Mb/s to 2.4883 Gb/s); Fiber Channel (133 Mb/s to 4.25 Gb/s*1). InfiniBand (2.5 Gb/s); USB (12 Mb/s to 480 Mb/s); Serial ATA (1.5 Gb/s, 3 Gb/s); Serial Attached SCSI (1.5 Gb/s, 3.0 Gb/s); IEEE 1394b (491.5 Mb/s to 1.966 Gb/s); Rapid I/O (1.25 Gb/s to 3.125 Gb/s); OIF Standards (2.488 Gb/s to 3.11 Gb/s); PCI Express (2.5 Gb/s).
Accurate, Simple, and Customizable Physical Layer Testing on High Speed Serial Standards. When designing to industry standards, analog validation and compliance testing (Front Side Bus, PCI Express, FB-DIMM, Serial ATA, Serial Attached SCSI, Fibre Channel, XAUI, IEEE1394b, RapidIO) is critical to ensure device interoperability. Patented Real-Time (RT-Eye®) clock recovery and Eye Rendering provides standard specific clock recovery, high precision eye diagrams for transition and non-transition bits and accurate jitter measurements, and de-emphasis measurements. Standard-specific compliance and analysis modules that configure the pass/fail waveform mask and measurement limit testing are also available as an option for PCI Express (Option PCE), for Serial ATA and SAS (Option SST), for FB-DIMM (Fully Buffered – Dual Inline Memory Module) (Option FBD), or InfiniBand (Option IBA)
10XL – 100 MSamples/ch
20XL – 200 MSamples/ch.
2XL – 20 MSamples/ch
5XL – 50 MSamples/ch
DVI – DVI Compliance Testing
ET3 – Ethernet Compliance Testing
FBD – FB-DIMM Compliance Module
HT3 – HDMI Compliance Testing
IBA – InfiniBand Compliance Module
JA3 – Advanced Jitter Analysis.
JE3 – Jitter Analysis Essentials
MTH – Serial Communications Mask Testing
PCE – PCI Express Compliance Module
PTH – Serial Protocol Trigger and Decode
PWR – Power Measurement and Analysis
R3DW – REPAIR SERVICE COVERAGE 3 YEARS (INCLUDES PRODUCT WARRANTY PERIOD). 3 YEAR PERIOD STARTS AT TIME OF CUSTOMER INSTRUMENT PURCHASE.
RTE – Real Time Eye for Serial testing
SST – Serial ATA, SAS Compliance Module
SVE – SignalVu Essentials – Vector Signal Analysis Software
USB – USB 2.0 Compliance Testing
VNM – CAN/LIN Timing and Protocol Decode